Hamamatsu Photonics System Inspects Micro-LEDs for Next-Gen Displays

Hamamatsu Photonics developed a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength of their light emissions.

This inspection system uses a photoluminescence (PL) measurement technique that is based on our advanced image processing technology and a newly developed imaging module. Hamamatsu calls this micro-LED PL inspection system the ‘MiNY  PL’, type number C15740-01.

Sales of this inspection system will begin on March 8, 2021.